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UHCT0030A Ultra-high Frequency Flexible Current Probe 200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / low Voltage Circuit Detection

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    Buy cheap UHCT0030A Ultra-high Frequency Flexible Current Probe 200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / low Voltage Circuit Detection from wholesalers
     
    Buy cheap UHCT0030A Ultra-high Frequency Flexible Current Probe 200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / low Voltage Circuit Detection from wholesalers
    • Buy cheap UHCT0030A Ultra-high Frequency Flexible Current Probe 200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / low Voltage Circuit Detection from wholesalers

    UHCT0030A Ultra-high Frequency Flexible Current Probe 200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / low Voltage Circuit Detection

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    Brand Name : MEASTEK
    Model Number : UHCT0030A
    Payment Terms : T/T,Western Union,MoneyGram
    Delivery Time : 5-8 work days
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    UHCT0030A Ultra-high Frequency Flexible Current Probe 200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / low Voltage Circuit Detection

    UHCT0030A Ultra-high Frequency Flexible Current Probe 200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / low Voltage Circuit Detection


    1.High sensitivity: 200mV/A, accurately captures tiny current signals, suitable for precision electronic equipment detection.


    2.Peak current 0.03kA: Meets low current scenario requirements, such as low-voltage circuit ripple analysis.


    3.High-frequency bandwidth 50MHz: Supports high-speed pulse signal measurement, suitable for IGBT/MOSFET dynamic analysis.


    4.Low noise design: Maximum noise is only 20mV Vp-p, ensuring clear and reliable data.


    5.Convenient USB power supply: Plug and play, no additional power adapter required.


    6.3.5mm ultra-thin probe ring: Easily handle narrow space wiring measurements.


    Technical Parameters

    ModelUHCT0030A
    Sensitivity (mV/A)200
    Peak current (KA)0.03
    Maximum noise (mV Vp-p)20
    Attenuation characteristics (%/ms)85
    Low frequency bandwidth -3dB (Hz)150
    Peak di/dt (A/ns)2.0
    High frequency bandwidth -3dB (MHz)50

    Note: If you need a larger range, please consult the manufacturer. It can be customized according to your requirements.
    Other Technical Parameters

    Accuracy

    2%

    Insulation withstand voltage value

    2KV

    Terminal load

    ≥100kΩ

    Power supply methodUSB 5V (standard adapter)
    Ring circumference100mm (customizable)
    Coil lead length1.0m (customizable)
    Operating temperature rangeIntegrator

    0℃ - 50℃

    Probe ring

    0℃ - 100℃

    Storage temperature range

    -40℃~80℃

    Front end dimensionsAbout 110(L)*45(W)*30(H)mm
    Probe weightIntegrator

    About125g

    Total weight

    About180g


    Product Description


    UHCT0030A Ultra-high Frequency Flexible Current Probe 200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / low Voltage Circuit Detection

    1) Input interface: probe ring input interface.
    2) Output interface: integrator output interface.
    3) USB 5V power supply interface: standard USB (type B) interface, USB power supply cable as standard.
    Probe induction ring body diameter: 3.5mm
    Coil circumference: 100mm


    Care And Maintenance

    *The current transmitter can only be guaranteed to operate safely and trouble-free if it is properly transported, stored, installed, and carefully operated and maintained.
    *Keep the probe clean and dry, and wipe it with a soft dry cloth.
    *When transporting the probe, put it in the standard packaging to prevent shock.
    *Do not force the flexible probe ring and connecting wire to avoid damage due to excessive twisting, bending or knotting.


    Packing List

    Integrator1 piece
    Flexible coil1 piece
    USB output adapter (5V/1A)1 piece
    USB power cable1 piece
    BNC output cable1 piece
    Electronic manual1 serving


    Notes

    1. To ensure measurement accuracy, the measured wire should pass through the center of the probe ring during measurement.
    2. The error is greatest at the junction of the induction rings, and the measured wire should try to avoid this area.
    3. Make sure the probe ring is inserted in place (to the bottom) during measurement, otherwise it will affect the measurement accuracy.
    4. When measuring the measured signal, if there is a strong magnetic field interference source nearby (such as a magnetic field radiation source composed of multiple coils), it should be kept as far away as possible, otherwise it will cause measurement errors.

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